Bilingual Publishing Group

Metric-based Few-shot Classification in Remote Sensing Image DOI:  https://doi.org/10.30564/aia.v4i1.4124 Abstract Target recognition based on deep learning relies on a large quantity of samples, but in some specific remote sensing scenes, the samples are very rare. Currently, few-shot learning can obtain high-performance target classification models using only a few samples, but most researches are based on the natural scene. Therefore, this paper proposes a metric-based few-shot classification technology in remote sensing. First, we constructed a dataset (RSD-FSC) for few-shot classification in remote sensing, which contained 21 classes typical target sample slices of remote sensing images. Second, based on metric learning, a k-nearest neighbor classification network is proposed, to find multiple training samples similar to the testing target, and then the similarity between the testing target and multiple similar samples is calculated to classify the testing target. Finally, the...

Metric-based Few-shot Classification in Remote Sensing Image DOI:  https://doi.org/10.30564/aia.v4i1.4124 Abstract Target recognition based on deep learning relies on a large quantity of samples, but in some specific remote sensing scenes, the samples are very rare. Currently, few-shot learning can obtain high-performance target classification models using only a few samples, but most researches are based on the natural scene. Therefore, this paper proposes a metric-based few-shot classification technology in remote sensing. First, we constructed a dataset (RSD-FSC) for few-shot classification in remote sensing, which contained 21 classes typical target sample slices of remote sensing images. Second, based on metric learning, a k-nearest neighbor classification network is proposed, to find multiple training samples similar to the testing target, and then the similarity between the testing target and multiple similar samples is calculated to classify the testing target. Finally, the...